- 题名/责任者:
- Scanning electron microscopy/1985/lll:an international journal of scanning electron microscopy,related techniques,and applications;pt.3 / guest editor R. P. Backer
- 出版发行项:
- New Orleans,La. : Scanning Electron Microscopy,Inc., 1985
- 载体形态项:
- 905-1304 p. : ill. ;. 29cm
- 中图法分类号:
- TM153-53
- 书目附注:
- Includes bibliographical references and index.
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