MARC状态：审校 文献类型：西文图书 浏览次数：3
- 题名/责任者:
- Microbeam analysis 1982 : proceedings of the 17th Annual Conference of the Society, Washington, D.C., 9-13 Aug. 1982 / editor: K.F.J. Heinrich.
- 出版发行项:
- San Francisco, Calif. : San Francisco Press, c1982.
- 载体形态项:
- xiv, 530 p. : ill. ; 29 cm.
- 团体责任者:
- Microbeam Analysis Society. Conference (17th : 1982 : Washington, D.C.)
- 附加个人名称:
- Heinrich, Kurt F. J.
- 附加团体名称:
- Microbeam Analysis Society.
- 论题主题:
- Electron probe analysis-Congresses.
- 论题主题:
- Microprobe analysis-Congresses
- 中图法分类号:
- TG115.23-53
- 书目附注:
- Includes bibliographical references and index.
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