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题名/责任者:

Physical aspects of microscopic characterization of materials : proceedings of the 5th Pfefferkorn Conference, held Oct. 2 to 7, 1986, at Brueggen, West Germany / edited by J. Kirschner, K. Murata, J.A. Venables ; managing editor, Sudha A. Bhatt.

出版发行项:

Chicago (AMF O'Hare), IL, U.S.A. : Scanning Microscopy International, c1987-

载体形态项:

ix, 253 p. : ill. ; 29 cm.

丛编题名:

Scanning microscopy. Supplement, 0892-953X ; 1 (1987)

个人责任者:

Kirschner,J.

会议名称:

Pfefferkorn Conference (5th : 1986 : Brueggen, West Germany)

附加个人名称:

Kirschner, J. (Jurgen).

附加个人名称:

Murata, K. (Kenji).

附加个人名称:

Venables, J. A.

附加团体名称:

Scanning Microscopy International.

论题主题:

Electron beams-Congresses.

论题主题:

Scanning electron microscopes-Congresses.

论题主题:

Electrons-Scattering-Congresses.

论题主题:

Materials-Microscopy-Congresses.

中图法分类号:

TN153-53

书目附注:

Includes bibliographical references and indexes.

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