MARC状态：审校 文献类型：西文图书 浏览次数：2
- 题名/责任者:
- Scanning electron microscopy/1985/1 : an international journal of scanning electron microscopy, related techniques and applications. pt. 1
- 出版发行项:
- Chicago : Scanning Electron Microscopy, Inc., 1985
- 载体形态项:
- ix, 467 p. : ill ; 29 cm.
- 论题主题:
- Scanning electron microscopes-Congresses.
- 中图法分类号:
- TM153-53
- 出版周期:
- Annual.
- 书目附注:
- Includes bibliographical references and index.
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