MARC状态:审校 文献类型:西文图书 浏览次数:3
- 题名/责任者:
- Introduction to analytical electron microscopy / edited by John J. Hren, Joseph I. Goldstein, and David C. Joy.
- 出版发行项:
- New York : Plenum Press, c1979.
- ISBN:
- 0306402807
- 载体形态项:
- xv, 601 p. : ill. ; 27 cm.
- 团体责任者:
- Microbeam Analysis Society.
- 附加个人名称:
- Hren, John J.
- 附加个人名称:
- Goldstein, Joseph, 1939-
- 附加个人名称:
- Joy, David C., 1943-
- 附加团体名称:
- Microbeam Analysis Society.
- 论题主题:
- Electron microscopy.
- 中图法分类号:
- TN153-53
- 一般附注:
- "Proceedings of a workshop on analytical electron microscopy, held in San Antonio, Texas, August 13-14, 1979, as part of the joint meeting of the Electron Microscopy Society of America and the Microbeam Analysis Society."
- 书目附注:
- Includes bibliographies and index.
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