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Online Public Access Catalogue

题名/责任者:

Scanning electron microscopy/1981 : an international journal of scanning electron microscopy related techniques, and applications / Part 2 guest editors: J.D. Shelburne...[et al.]

出版发行项:

AMF O'Hare [Chicago], IL : Scanning Electron Microscopy, Inc., c1981.

ISBN:

0931288185

载体形态项:

516 p. : ill. ; 29 cm.

附加非控制题名:

SEM

个人责任者:

Shelburne, J. D.

附加个人名称:

Shelburne, J. D.

附加团体名称:

Scanning Electron Microscopy, Inc.

论题主题:

Scanning electron microscopy-Periodicals.

论题主题:

Microscopy, Electron, Scanning-Periodicals

中图法分类号:

TN153-53

一般附注:

"An international review of advances in instrumentation, techniques, theory and physical applications of the scanning electron microscope."

豆瓣简介：