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- 题名/责任者:
- Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.
- 出版发行项:
- New York : Marcel Dekker, c1982.
- ISBN:
- 0824715535
- 载体形态项:
- xiv, 793 p. : ill. ; 27 cm.
- 丛编说明:
- Optical engineering ; v. 1
- 丛编统一题名:
- Optical engineering (Marcel Dekker, Inc.) ; v. 1.
- 个人责任者:
- Murr, Lawrence Eugene.
- 论题主题:
- Electron microscopy.
- 论题主题:
- Field ion microscopy.
- 论题主题:
- Microprobe analysis.
- 中图法分类号:
- TN153
- 书目附注:
- Includes bibliographical references and indexes.
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