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题名/责任者:

Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt.

版本说明:

2nd, rev. ed.

出版发行项:

Amsterdam : North-Holland Pub. Co., 1978.

ISBN:

0444851305 (set)

ISBN:

0444851283 (v.1)

ISBN:

0444851291 (v.2)

载体形态项:

2 v. (xvii, 847 p., [1] fold. leaf of plates) : ill. ; 23 cm.

个人责任者:

Amelinckx, S.

附加个人名称:

Amelinckx, S. (Severin).

附加个人名称:

Gevers, Reino Paul.

附加个人名称:

Landuyt, J. van.

附加会议名称:

International Summer Course on Material Science (1969 : Antwerp, Belgium). Modern diffraction and imaging techniques in material science.

论题主题:

Electron microscopy-Congresses.

论题主题:

Electrons-Diffraction-Congresses.

论题主题:

Imaging systems-Congresses.

中图法分类号:

TH742

一般附注:

Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.

一般附注:

Library has: v. 1-2.

书目附注:

Includes bibliographical references and index.

内容附注:

v. 1. Electron microscopy -- v. 2. Imaging and diffraction techniques.

豆瓣简介：