MARC状态：审校 文献类型：西文图书 浏览次数：2
- 题名/责任者:
- Scanning electron microscopy/1981 : an international journal of scanning electron microscopy related techniques, and applications Part 4/ guest editors: R.M. Albrecht...[et al.]
- 出版发行项:
- AMF O'Hare [Chicago], IL : Scanning Electron Microscopy, Inc., c1981.
- ISBN:
- 0931288207
- 载体形态项:
- 312. : ill. ; 29 cm.
- 个人责任者:
- Albrecht, R. M.
- 附加个人名称:
- Albrecht, R. M.
- 论题主题:
- Scanning electron microscopy-Periodicals.
- 论题主题:
- Microscopy, Electron, Scanning-Periodicals
- 中图法分类号:
- TN153-53
- 一般附注:
- "An international review of advances in instrumentation, techniques, theory and physical applications of the scanning electron microscope."
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