MARC状态：审校 文献类型：西文图书 浏览次数：2
- 题名/责任者:
- Scanning electron microscopy 1980/II : an international Journal of scanning electron microscopy, related techniques and applications part II / Scanning Electron Microscopy.
- 出版发行项:
- Chicago : Scanning Electron Microscopy, 1980.
- ISBN:
- 0931288126
- 载体形态项:
- 658 p. : ill. ; 28 cm.
- 附加团体名称:
- Scanning Electron Microscopy.
- 中图法分类号:
- TN153-2
- 一般附注:
- Includes indexes.
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