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题名/责任者:

X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California / Thomas W. Rusch, chairman/editor ; cooperating organizations, Institute of Optics/University of Rochester ... [et al.].

出版发行项:

Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1986.

ISBN:

0892527250 (pbk.)

载体形态项:

vi, 156 p. : ill. ; 28 cm.

丛编题名:

Proceedings of SPIE--the International Society for Optical Engineering ; v. 690

附加个人名称:

Rusch, Thomas William.

附加团体名称:

Society of Photo-optical Instrumentation Engineers.

论题主题:

Non-destructive testing-Congresses.

论题主题:

X-ray spectroscopy-Congresses.

论题主题:

Materials-Testing-Congresses.

中图法分类号:

TN29-53

书目附注:

Includes bibliographical references and index.

豆瓣简介：