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题名/责任者:

International Test Conference : proceedings : the three faces of test : design, characterization, production / sponsored by the IEEE Computer Society Test Technology Committee, IEEE Philadelphia Section.

出版发行项:

Silver Spring, Md. : IEEE Computer Society Pr., c1984.

ISBN:

0818605480

载体形态项:

xxxi, 885 p. : ill. ; 28 cm.

附加非控制题名:

Test conference.

附加非控制题名:

Three faces of test.

会议名称:

International Test Conference (1984)

附加团体名称:

IEEE Computer Society. Test Technology Committee.

附加团体名称:

Institute of Electrical and Electronics Engineers. Philadelphia Section.

论题主题:

Integrated circuits-Testing-Congresses.

论题主题:

Automatic checkout equipment-Congresses.

中图法分类号:

TB22-53

书目附注:

Includes bibliographical references and index.

豆瓣简介：