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题名/责任者:

Symposium on X-Ray and Electron Probe Analysis : papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.

出版发行项:

Philadelphia : American Society for Testing and Materials, 1964.

载体形态项:

vi, 209 p. : ill. ; 24 cm.

丛编说明:

ASTM special technical publication ; no. 349

团体责任者:

American Society for Testing and Materials. Committee E-2 on Emission Spectroscopy.

附加团体名称:

American Society for Testing and Materials. Committee E-4 on Metallography.

附加会议名称:

Symposium on X-Ray and Electron Probe Analysis (1963 : Atlantic City)

丛编团体名称:

American Society for Testing and Materials. Special technical publication ; no. 349.

论题主题:

X-ray spectroscopy-Congresses.

论题主题:

Probes (Electronic instruments)-Congresses.

中图法分类号:

O657.3

一般附注:

"Sponsored jointly by ASTM Committees E-2 on Emission Spectroscopy and E-4 on Electron Metallography."

书目附注:

Includes bibliographical references.

豆瓣简介：