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西文图书1.The bugbook I : logic & memory experiments using TTL integrated circuits / TN4/R774/1
馆藏复本:2
可借复本:2 Rony, Pteer R.
E & L Instruments, Inc., 1975.
(0) 馆藏 -
西文图书2.The bugbook II : logic & memory experiments using TTL integrated circuits / TN4/R774/2
馆藏复本:2
可借复本:2 Rony, Pteer R.
E & L Instruments, Inc., 1974.
(0) 馆藏 -
西文图书3.Interfacing and scientific data communications experiments / 73.4616/R774
馆藏复本:3
可借复本:3 Peter R. Rony ... [et al.].
H. W. Sams, c1979.
(0) 馆藏

