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西文图书1.Electron optical systems for microscopy, microanalysis & microlithography : proceedings of the 3r... TN153-53/P524
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可借复本:1 Pfefferkorn Conference
Scanning Electron Microscopy, c1984.
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西文图书2.Physical aspects of microscopic characterization of materials : proceedings of the 5th Pfefferkor... TN153-53/K61
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可借复本:1 Kirschner,J.
Scanning Microscopy International, c1987-
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