检索到 13 条 分类号=TN-532 的结果
-
西文图书1.Proceedings Fifth National Symposium on Reliability & Quality Control in Electronics : Philadelph... TN-532/N277-3
馆藏复本：1
可借复本：1 National Symposium on Reliability & Quality Control in Electronics
Institute of Radio Engineers, 1959].
(0) 馆藏 -
西文图书2.Proceedings seventh National Symposium on Reliability & Quality Control in Electronics : Philadel... TN-532/N277-4
馆藏复本：2
可借复本：2 National Symposium on Reliability & Quality Control in Electronics
Institute of Radio Engineers, 1961].
(0) 馆藏 -
西文图书3.SWIEEECO record : 21st Annual Southwestern I.E.E.E. Conference & Exhibition, April 23, 24, 25, 19... TN-532/S728
馆藏复本：1
可借复本：1 Southwestern I.E.E.E. Conference & Exhibition
Institute of Electrical and Electronics Engineers, 1969.
(0) 馆藏 -
西文图书4.IECON' 90 : 16th annual conference of IEEE Industrial Electronics Society : November 27-30, 1990,... TN-532/I61/2
馆藏复本：1
可借复本：1 International Conference on Industrial Electronics, Control, and Instrumentation
Institute of Electrical and Electronics Engineers ; c1990.
(0) 馆藏 -
西文图书5.Conference proceedings : 2nd National Convention on Military Electronics, theme: missiles and Ele... TN-532/N277-2
馆藏复本：1
可借复本：1 National Convention on Military Electronics
Institute of Radio Engineers, 1958
(0) 馆藏 -
西文图书6.Conference Proceedings 1962 national winter convention on military electronics / TN-532/N277
馆藏复本：1
可借复本：1 National Winter Convention Military Electronics
s.n.], 1962.
(0) 馆藏 -
西文图书7.1970 swieeeco record of technical papers : 22nd Annual Southwestern IEEE Conference and Exhibiti... TN-532/I22
馆藏复本：1
可借复本：1 IEEE Conference and Exhibition
IEEE, c1970.
(0) 馆藏 -
西文图书8.1967 Annual Symposium on Reliability / TN-532/S989-3
馆藏复本：1
可借复本：1 Symposium on Reliability
Institute of Electrical and Electronics Engineers, 1967].
(0) 馆藏 -
西文图书9.The Engineering uses of holography / TN-532/U58
馆藏复本：1
可借复本：1 University of Strathclyde.
University Press, 1970.
(0) 馆藏 -
西文图书10.1975 IEEE Intercon Conference record : technical papers presented at the 1975 International Conve... TN-532/I59
馆藏复本：2
可借复本：2 Institute of Electrical and Electronics Engineers.
The Institute, c1975.
(0) 馆藏 -
西文图书11.Symposium on Microelectronics and Large Systems : November 17-18, 1964, Dept. of the Interior aud... TN-532/S989-2
馆藏复本：2
可借复本：2 Symposium on Microelectronics and Large Systems
Spartan Books, 1965.
(0) 馆藏 -
西文图书12.Proceedings 1969 Annual Symposium on Reliability : Chicago, Illinois, January 21, 22, 23, 1969 / TN-532/S989
馆藏复本：1
可借复本：1 Symposium on Reliability
Institute of Electrical and Electronics Engineers, 1969].
(0) 馆藏 -
西文图书13.First International Conference on Electron and Ion Beam Science and Technology / TN-532/I61
馆藏复本：2
可借复本：2 International Conference on Electron and Ion Beam Science and Technology
Wiley, c1965.
(0) 馆藏
