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检索到 10 条 分类号=TN16-53 的结果    

 


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  1. 西文图书1.Developments in electron microscopy and analysis : proceedings of EMAG 75 held at the University... TN16-53/V447

    馆藏复本：2
    可借复本：2     Venables, J. A.
    Academic Press, 1976.
    (0) 馆藏

  2. 西文图书2.EUREM 88 : proceedings of the 9th European Congress on Electron Microscopy held in York, England,... TN16-532/E89-2/1

    馆藏复本：1
    可借复本：1     European Congress on Electron Microscopy
    Institute of Physics, c1988.
    (0) 馆藏

  3. 西文图书3.Electron microscopy and analysis, 1981 : proceedings of the Institute of Physics Electron Microsc... TN16-532/I59-4

    馆藏复本：2
    可借复本：2     Institute of Physics (Great Britain).
    Institute of Physics, 1982.
    (0) 馆藏

  4. 西文图书4.Electron microscopy and analysis, 1983 : proceedings of the Institute of Physics Electron Microsc... TN16-532/I59-2

    馆藏复本：2
    可借复本：2     Institute of Physics Electron Microscopy and Analysis Group conference
    Institute of Physics, c1984.
    (0) 馆藏

  5. 西文图书5.Developments in electron microscopy and analysis, 1977 : proceedings of the Institute of Physics... TN16-532/M678

    馆藏复本：2
    可借复本：2     Misell, D. L.
    Institute of Physics, 1977.
    (0) 馆藏

  6. 西文图书6.Electron microscopy and analysis : proceedings of the 25th Anniversary Meeting of the Electron Mi... TN16-532/I59-3

    馆藏复本：2
    可借复本：2     Institute of Physics (Great Britain).
    Institute of Physics, c1971.
    (0) 馆藏

  7. 西文图书7.Electron microscopy and analysis, 1979 : proceedings of the Institute of Physics Electron Microsc... TN16-532/I59

    馆藏复本：1
    可借复本：1     Institute of Physics Electron Microscopy and Analysis Group conference
    Institute of Physics, c1980.
    (0) 馆藏

  8. 西文图书8.Electron microscopy 1972 : proceedings of the Fifth European Congress on Electron Microscopy, Uni... TN16-532/E89

    馆藏复本：1
    可借复本：1     European Congress on Electron Microscopy
    Institute of Physics, 1972.
    (0) 馆藏

  9. 西文图书9.Scanning tunneling microscopy and related methods / TN16-532/N279

    馆藏复本：1
    可借复本：1     NATO Advanced Study Institute on Basic Concepts and Applications of Scanning Tunneling Microscopy
    Kluwer Academic Publishers, c1990.
    (0) 馆藏

  10. 西文图书10.Seventh National Conference on Electron Probe Analysis : presented by the Electron Probe Analysis So 73.66083

    馆藏复本：2
    可借复本：2     National Conference on Electron Probe Analysis
    L. Vassamillet, Carnegie-Mellon University, 1972.
    (0) 馆藏

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