检索到 8 条 主题词=Automatic checkout equipment. 的结果
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西文图书1.International Test Conference : proceedings : the three faces of test : design, characterization,... TB22-53/I61
馆藏复本：1
可借复本：1 International Test Conference
IEEE Computer Society Pr., c1984.
(0) 馆藏 -
西文图书2.Autotestcon '76 : held at the Inn of the Six Flags, Arlington, Texas, November 10-12, 1976 : form... TP274/I22
馆藏复本：1
可借复本：1 IEEE Aerospace and Electronic Systems Society.
IEEE Aerospace and Electronic Systems Society, c1976.
(0) 馆藏 -
西文图书3.Autotestcon '76 : held at the Inn of the Six Flags, Arlington, Texas, November 10-12, 1976 : form... TP27/A939
馆藏复本：1
可借复本：1 Autotestcon '76
IEEE Aerospace and Electronic Systems Society, c1976.
(0) 馆藏 -
西文图书4.Autotestcon '88 symposium proceedings : futuretest : October 4-6, 1988, IEEE International Automa... TP274/A939
馆藏复本：1
可借复本：1 Autotestcon '88
IEEE, c1988.
(0) 馆藏 -
西文图书5.Industrial optical sensing / TP212/C289
馆藏复本：1
可借复本：1 Carney,James
International Society for Optical Engineering, c1988.
(0) 馆藏 -
西文图书6.Error detecting codes, self-checking circuits and applications / TP23/W149
馆藏复本：2
可借复本：2 Wakerly, John F.
North-Holland, c1978.
(0) 馆藏 -
西文图书7.Autotestcon '81 proceedings, October 19-21, 1981, Orlando Hyatt House, Orlando, Florida. 73.865083/I61
馆藏复本：2
可借复本：2 AUTOTESTCON
Institute of Electrical and Electronic Engineers ; c1981.
(0) 馆藏 -
西文图书8.ATE : automatic test equipment / 73.865/S889
馆藏复本：3
可借复本：3 Stover, Allan C.
McGraw-Hill Book Co., c1984.
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