-
西文图书1.Field emission and field ionization. O436.4/G633
馆藏复本:1
可借复本:1 Gomer, R.
Harvard University Press ; 1961.
(0) 馆藏
-
西文图书2.Electron and ion microscopy and microanalysis : principles and applications / TN153/M979
馆藏复本:1
可借复本:1 Murr, Lawrence Eugene.
Marcel Dekker, c1982.
(0) 馆藏
-
西文图书3.Field-ion microscopy / O7/W134
馆藏复本:3
可借复本:3 Wagner, R.
Springer-Verlag, 1982.
(0) 馆藏