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西文图书1.Electron microscopy and analysis, 1981 : proceedings of the Institute of Physics Electron Microsc... TN16-532/I59-4
馆藏复本:2
可借复本:2 Institute of Physics (Great Britain).
Institute of Physics, 1982.
(0) 馆藏 -
西文图书2.Microprobe analysis, O657.35/A544
馆藏复本:2
可借复本:2 Andersen, Christian A.,
Wiley [1973]
(0) 馆藏 -
西文图书3.Electron microprobe analysis / TH744.15/R326
馆藏复本:1
可借复本:1 Reed, S. J. B.
Cambridge University Press, c1975.
(0) 馆藏 -
西文图书4.Microbeam analysis 1982 : proceedings of the 17th Annual Conference of the Society, Washington, D... TG115.23-53/M626
馆藏复本:1
可借复本:1 Microbeam Analysis Society.
San Francisco Press, c1982.
(0) 馆藏 -
西文图书5.Electron microscopy and analysis, 1979 : proceedings of the Institute of Physics Electron Microsc... TN16-532/I59
馆藏复本:1
可借复本:1 Institute of Physics Electron Microscopy and Analysis Group conference
Institute of Physics, c1980.
(0) 馆藏 -
西文图书6.Electron and ion microscopy and microanalysis : principles and applications / TN153/M979
馆藏复本:1
可借复本:1 Murr, Lawrence Eugene.
Marcel Dekker, c1982.
(0) 馆藏

