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西文图书1.Particle characterization in technology / 81.103/P273/2, TB44/B399/1, TB44/B399...
馆藏复本:4
可借复本:4 Beddow, John K.
CRC Press, c1984.
(0) 馆藏 -
西文图书2.Electromagnetic scattering and its applications / O441/B361
馆藏复本:4
可借复本:4 Bayvel, L. P.
Applied Science, c1981.
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西文图书3.Particle size distribution : assessment and characterization / TB324-532/P969
馆藏复本:1
可借复本:1 Provder, Theodore
American Chemical Society, 1987.
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西文图书4.Particle sizing and spray analysis, August 21, 1985, San Diego, California / TB302.1-53/P963/573
馆藏复本:1
可借复本:1 Norman Chigier, Gerald W. Stewart chairmen/editors ; cooperating organizations, Optical Sciences...
SPIE--the International Society for Optical Engineering, c1985.
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西文图书5.Fine particle measurement : size, surface, and pore volume / O572.2/O75
馆藏复本:1
可借复本:1 Orr, Clyde.
Macmillan, 1959.
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西文图书6.Principles, methods, and application of particle size analysis / P512.2/S995
馆藏复本:1
可借复本:1 edited by James P.M. Syvitski.
Cambridge University Press, 1991.
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