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西文图书1.Advanced scanning electron microscopy and X-ray microanalysis / TN16/N535
馆藏复本:1
可借复本:1 Newbury, Dale E.
Plenum Press, c1986.
(0) 馆藏
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西文图书2.Scanning electron microscopy/1981 : an international journal of scanning electron microscopy, rel... TN153-53/S283/1
馆藏复本:1
可借复本:1 guest editors, N.J. Zaluzec, M.H.Barrows and G. E. McGuire
Scanning Electron Microscopy, Inc., 1981
(0) 馆藏
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西文图书3.Scanning electron microscopy/1985/1 : an international journal of scanning electron microscopy, r... TM153-53/S283/1
馆藏复本:1
可借复本:1
Scanning Electron Microscopy, Inc., 1985
(0) 馆藏
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西文图书4.Physical aspects of microscopic characterization of materials : proceedings of the 5th Pfefferkor... TN153-53/K61
馆藏复本:1
可借复本:1 Kirschner,J.
Scanning Microscopy International, c1987-
(0) 馆藏
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西文图书5.An atlas of metal damage : surface examination by scanning electron microscope / TG/E57
馆藏复本:1
可借复本:1 Engel, Lothar.
Wolfe Pub. Ltd. , 1981.
(0) 馆藏