机读格式显示(MARC)

• 000 01794cam a2200385 a 4500

• 001 0000328974

• 003 CAL

• 005 20200901085800.0

• 008 960410s1978 ne af b 10100 eng

• 010 __ |a 78022081 //r89

• 020 __ |a 0444851305 (set)

• 020 __ |a 0444851283 (v.1)

• 020 __ |a 0444851291 (v.2)

• 040 __ |d ICU |c WUL

• 090 __ |a TH742/A498(2)/1

• 090 __ |a TH742/A498(2)/2

• 093 __ |a TH742

• 099 __ |a CAL 021999623765 |a CAL 022000379366 |a CAL 021999668113 |a CAL 021999668114 |a CAL 022012031939

• 100 1_ |a Amelinckx, S.

• 245 00 |a Diffraction and imaging techniques in material science / |c editors, S. Amelinckx, R. Gevers, J. Van Landuyt.

• 250 __ |a 2nd, rev. ed.

• 260 __ |a Amsterdam : |b North-Holland Pub. Co., |c 1978.

• 300 __ |a 2 v. (xvii, 847 p., [1] fold. leaf of plates) : |b ill. ; |c 23 cm.

• 500 __ |a Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.

• 504 __ |a Includes bibliographical references and index.

• 505 0_ |a v. 1. Electron microscopy -- v. 2. Imaging and diffraction techniques.

• 500 __ |a Library has: v. 1-2.

• 650 _0 |a Electron microscopy |x Congresses.

• 650 _0 |a Electrons |x Diffraction |x Congresses.

• 650 _0 |a Imaging systems |x Congresses.

• 700 1_ |a Amelinckx, S. |q (Severin). |0 CAL n2005004846# |7 ba0yba0y

• 700 1_ |a Gevers, Reino Paul. |0 CAL n2005084666# |7 ba0yba0y

• 700 1_ |a Landuyt, J. van. |0 CAL n2005135589# |7 ba0yba0y

• 711 2_ |a International Summer Course on Material Science |d (1969 : |c Antwerp, Belgium). |t Modern diffraction and imaging techniques in material science.

• 998 __ |a WUL