机读格式显示(MARC)

• 000 01135nam a2200289 4500

• 001 0000328717

• 003 CAL

• 005 20200817112200.0

• 008 970416s1981 ilua b 000 0 eng

• 010 __ |a 88641011 //r92 |z sn 81001691

• 020 __ |a 0931288193

• 040 __ |c SJT

• 041 0_ |a eng

• 090 __ |a TN153-53/A341/3

• 093 __ |a TN153-53

• 099 __ |a CAL 022000340269

• 100 0_ |a Albrecht, R. M.

• 245 00 |a Scanning electron microscopy/1981 : |b an international journal of scanning electron microscopy related techniques, and applications / |n Part 3 |c guest editors: R.M. Albrecht...[et al.]

• 260 __ |a AMF O'Hare [Chicago], IL : |b Scanning Electron Microscopy, Inc., |c c1981.

• 300 __ |a 624 p. : |b ill. ; |c 29 cm.

• 500 __ |a "An international review of advances in instrumentation, techniques, theory and physical applications of the scanning electron microscope."

• 650 _0 |a Scanning electron microscopy |x Periodicals.

• 650 _2 |a Microscopy, Electron, Scanning |x Periodicals

• 700 1_ |a Albrecht, R. M. |0 CAL n2005223362# |7 ba0yba0y

• 710 2_ |a Scanning Electron Microscopy, Inc.

• 740 0_ |a SEM

• 998 __ |a SJT