机读格式显示(MARC)

• 000 00784cam a2200241 4500

• 001 0000155841

• 003 CAL

• 005 20200814083800.0

• 008 060913s1983 ne a b 00110 eng

• 020 __ |a 044486315X

• 040 __ |c SJT

• 090 __ |a 53.819/B414

• 090 __ |a O77-33/B414

• 093 __ |a O77-33

• 094 __ |a 53.819 |2 4

• 099 __ |a CAL 022000308799

• 100 1_ |a Beeler, J.R.

• 245 10 |a Radiation effects, computer experiments / |c J.R. Beeler, Jr.

• 260 __ |a Amsterdam ; |a New York : |b North-Holland Pub. Co. ; |a New York : |b Elsevier Science Pub. Co. [distributor], |c 1983.

• 300 __ |a xviii, 881 p. : |b ill. ; |c 23 cm.

• 440 _0 |a Defects in crystalline solids ; |v v. 13

• 504 __ |a Includes bibliographies and index.

• 650 _0 |a Materials |x Effect of radiation on |x Data processing.