机读格式显示(MARC)

• 000 01004cam a2200277 a 4500

• 001 0000333008

• 003 CAL

• 005 20200808160100.0

• 008 760506s1977 nyua b 000 0 eng

• 010 __ |a 76017013

• 020 __ |a 0070042306

• 035 __ |a 76017013

• 040 __ |c SCT

• 090 __ |a TN710/B396

• 093 __ |a TN710 |2 3

• 099 __ |a CAL 022000940051

• 100 1_ |a Becker, Peter W. |0 CAL n2005016056# |7 ba0yba0y

• 245 10 |a Design of systems and circuits for maximum reliability or maximum production yield / |c Peter W. Becker, Finn Jensen.

• 260 __ |a New York : |b McGraw-Hill, |c c1977.

• 300 __ |a xiv, 293 p. : |b ill. ; |c 24 cm.

• 504 __ |a Includes bibliographical references (p. 281-289) and index.

• 650 _0 |a Electronic circuit design |x Data processing.

• 650 _0 |a Electronic systems |x Design and construction |x Data processing.

• 650 _0 |a Electronic apparatus and appliances |x Reliability |x Data processing.

• 700 1_ |a Jensen, Finn, |d 1937- |0 CAL n2005117800# |7 ba0yba0y

• 998 __ |a SCT