机读格式显示(MARC)

• 000 00463nam a22001575a 4500

• 001 0000359030

• 005 20201020162600.0

• 008 900412s1977 001 0 eng d

• 040 __ |c WUL

• 090 __ |a TN306/R382

• 093 __ |a TN306

• 100 1_ |a Reliability analysis center.

• 245 10 |a Discrete semiconductor reliability transistor/diode data. |k monograph

• 260 __ |a [S.l.] : |b ILT Research Institute, |c 1977.

• 300 __ |a 304 p. |c 28cm

• 700 1_ |a Nicholls, David B., |e jt. auth.