机读格式显示(MARC)

• 000 01382cam a2200313 a 4500

• 001 0000333162

• 003 CAL

• 005 20200810094100.0

• 008 981216s1980 enka b 101 0 eng

• 010 __ |a 80485922 //r842

• 015 __ |a GB***

• 020 __ |a 0854981438

• 040 __ |c SJT |d JLU

• 050 00 |a QH212.E4 |b E379

• 090 __ |a TN16-532/I59

• 093 __ |a TN16-532 |2 5

• 099 __ |a CAL 022000330658 |a CAL 022000405127 |a CAL 022000815899

• 111 2_ |a Institute of Physics Electron Microscopy and Analysis Group conference |d (1979 : |c Brighton, University of Sussex)

• 245 10 |a Electron microscopy and analysis, 1979 : |b proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) / |c edited by T. Mulvey.

• 260 __ |a Bristol : |b Institute of Physics, |c c1980.

• 300 __ |a xv, 472 p. : |b ill. ; |c 24 cm.

• 490 1_ |a Conference series - Institute of Physics ; no. 52 |x 0305-2346

• 504 __ |a Includes bibliographical references and indexes.

• 650 _0 |a Electron microscopy |v Congresses.

• 650 _0 |a Microprobe analysis |v Congresses

• 700 1_ |a Mulvey, T. |0 CAL n2004533753# |7 ba0yba0y

• 710 2_ |a Institute of Physics (Great Britain). |b Electron Microscopy and Analysis Group.

• 830 _0 |a Conference series (Institute of Physics (Great Britain) ; |v no. 52.

• 998 __ |a SJT