机读格式显示(MARC)

• 000 01403nam a2200313 a 4500

• 001 0000329621

• 003 CAL

• 005 20200729091100.0

• 008 960415s1987 ilua rb 101 0 eng d

• 040 __ |a PUL |c PUL

• 090 __ |a TN153-53/K61

• 093 __ |a TN153-53

• 099 __ |a CAL 022000240743 |a CAL 022002037031

• 100 0_ |a Kirschner,J.

• 111 2_ |a Pfefferkorn Conference |n (5th : |d 1986 : |c Brueggen, West Germany)

• 245 10 |a Physical aspects of microscopic characterization of materials : |b proceedings of the 5th Pfefferkorn Conference, held Oct. 2 to 7, 1986, at Brueggen, West Germany / |c edited by J. Kirschner, K. Murata, J.A. Venables ; managing editor, Sudha A. Bhatt.

• 260 __ |a Chicago (AMF O'Hare), IL, U.S.A. : |b Scanning Microscopy International, |c c1987-

• 300 __ |a ix, 253 p. : |b ill. ; |c 29 cm.

• 440 _0 |a Scanning microscopy. |p Supplement, |x 0892-953X ; |v 1 (1987)

• 504 __ |a Includes bibliographical references and indexes.

• 650 _0 |a Electron beams |x Congresses.

• 650 _0 |a Scanning electron microscopes |x Congresses.

• 650 _0 |a Electrons |x Scattering |x Congresses.

• 650 _0 |a Materials |x Microscopy |x Congresses.

• 700 1_ |a Kirschner, J. |q (Jurgen). |0 CAL n2005279643# |7 ba0yba0y

• 700 1_ |a Murata, K. |q (Kenji). |0 CAL n2005175772# |7 ba0yba0y

• 700 1_ |a Venables, J. A. |0 CAL n2005253244# |7 ba0yba0y

• 710 2_ |a Scanning Microscopy International.

• 998 __ |a PUL