机读格式显示(MARC)

• 000 01050nam a2200289 4500

• 001 0000333302

• 003 CAL

• 005 20200810133200.0

• 008 961227s1982 caua b 10110 eng

• 010 __ |a 83646479 |z sn 82000465

• 035 __ |a (OCoLC)7246538

• 040 __ |c SJT

• 050 00 |a QD98.E4 |b M5

• 090 __ |a TG115.23-53/M626

• 093 __ |a TG115.23-53

• 099 __ |a CAL 022000338648

• 110 2_ |a Microbeam Analysis Society. |b Conference |n (17th : |d 1982 : |c Washington, D.C.)

• 245 10 |a Microbeam analysis 1982 : |b proceedings of the 17th Annual Conference of the Society, Washington, D.C., 9-13 Aug. 1982 / |c editor: K.F.J. Heinrich.

• 260 __ |a San Francisco, Calif. : |b San Francisco Press, |c c1982.

• 300 __ |a xiv, 530 p. : |b ill. ; |c 29 cm.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Electron probe analysis |x Congresses.

• 650 _0 |a Microprobe analysis |x Congresses

• 700 1_ |a Heinrich, Kurt F. J. |0 CAL n2005102985# |7 ba0yba0y

• 710 2_ |a Microbeam Analysis Society.

• 920 __ |a 242120 |z 1

• 998 __ |a SJT