机读格式显示(MARC)

• 000 01348cam a2200325 a 4500

• 001 0000327196

• 003 CAL

• 005 20200630143500.0

• 008 910627s1989 us a b 101 0 eng u

• 010 __ |a 88063624

• 020 __ |a 0819400440

• 035 __ |a CUW000224129

• 040 __ |c BJP

• 090 __ |a (E)/O46/3

• 093 __ |a O460.85

• 099 __ |a CAL 022000350712

• 111 2_ |a ECO1 |d (1988 : |c Hamburg, Germany)

• 245 10 |a Surface measurement and characterization : |b ECO1 19-21 September, 1988, Hamburg, Federal Republic of Germany / |c Jean M. Bennett chair editor.

• 260 __ |a Bellingham, Wash. : |b SPIE--The International Society for Optical Engineering, |c c1989.

• 300 __ |a viii, 308 p. : |b ill. ; |c 29 cm.

• 440 _0 |a Proceedings of SPIE--the International Society for Optical Engineering ; |v v. 1009

• 500 __ |a "Sponsored by EPS--European Physical Society, Europtica--the European Federation for Applied Optics, SPIE--the Internaitonal Society for Optical Engineering."

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Surface roughness |x Measurement |v Congresses.

• 650 _0 |a Surfaces (Technology) |v Congresses.

• 700 1_ |a Bennett, Jean M.

• 710 2_ |a European Physical Society.

• 710 2_ |a European Federation for Applied Optics.

• 710 2_ |a Society of Photo-optical Instrumentation Engineers.

• 998 __ |a LHML