机读格式显示(MARC)

• 000 00897nam a2200277 a 4500

• 001 0000333365

• 003 CAL

• 005 20200810151000.0

• 008 851114s1986 nyua b 001 0 eng d

• 010 __ |a 85028261

• 020 __ |a 0306421402

• 035 __ |a 3740445

• 040 __ |a NLM |c NLM |d OSU

• 060 00 |a QH 212.S3 |b A244 (P)

• 090 __ |a TN16/N535

• 093 __ |a TN16 |2 3

• 099 __ |a CAL 021999653439 |a CAL 022000306872

• 100 0_ |a Newbury, Dale E. |0 CAL n2005179223# |7 ba0yba0y

• 245 00 |a Advanced scanning electron microscopy and X-ray microanalysis / |c Dale Newbury ... [et al.]

• 260 __ |a New York : |b Plenum Press, |c c1986.

• 300 __ |a xii, 454 p. : |b ill. ; |c 23 cm.

• 504 __ |a Includes bibliographical references (p. 435-448) and index.

• 650 _0 |a Scanning electron microscopes.

• 650 _0 |a X-ray microanalysis.

• 700 1_ |a Newbury, Dale E. |0 CAL n2005179223# |7 ba0yba0y

• 998 __ |a SJT