机读格式显示(MARC)

• 000 01182cam 2200313 a 4500

• 001 0000157241

• 003 CAL

• 005 20060918141200.0

• 008 060918s1976 nyua b 100 0 eng

• 010 __ |a 76150716

• 040 __ |a DLC |c DLC

• 090 __ |a 73.879083Q2

• 093 __ |a TP36-53 |2 4

• 094 __ |a 73.879083 |2 3

• 099 __ |a CAL 022001383204

• 110 2_ |a Institute of Electrical and Electronics Engineers. |b Industrial Electronics and Control Instrumentation Group. |b Conference |d (1976 : |c Philadelphia, Pennsylvania)

• 245 10 |a 1977 IECI annual conference proceedings

• 246 30 |a Industrial applications of microprocessors, process measurement, and failure mode analysis

• 246 30 |a IECI '77

• 260 __ |a New York : |b Institute of Electrical and Electronics Engineers, |c c1977.

• 300 __ |a viii, 219 p. : |b ill. ; |c 29 cm.

• 504 __ |a Includes bibliographcial references.

• 650 _0 |a Process control |v Congresses.

• 650 _0 |a Microprocessors |v Congresses.

• 710 2_ |a Institute of Electrical and Electronics Engineers. |b Industrial Electronics and Control Instrumentation Group.

• 920 __ |a 211060 |z 1

• 920 __ |a 244050 |z 1

• 920 __ |a 223140 |z 1

• 998 __ |a SCT