机读格式显示(MARC)

• 000 00874cam a2200265 a 4500

• 001 0000330239

• 003 CAL

• 005 20200810105500.0

• 008 981214s1985 wb a b 001 0 eng d

• 020 __ |a 3540135308

• 020 __ |a 0387135308

• 040 __ |c SJT |d JLU

• 050 00 |a QH212.S3 |b R452 1985

• 090 __ |a TN153-53/R363

• 093 __ |a TN153-53 |2 5

• 099 __ |a CAL 022000306651

• 100 1_ |a Reimer, Ludwig, |d 1928- |0 CAL n2005203049# |7 ba0yba0y

• 245 10 |a Scanning electron microscopy : |b physics of image formation and microanalysis / |c Ludwig Reimer.

• 260 __ |a Berlin ; |a New York : |b Springer-Verlag, |c c1985.

• 300 __ |a xviii, 457 p. : |b ill. ; |c 23 cm.

• 490 0_ |a Springer series in optical sciences ; |v v. 45

• 504 __ |a Includes bibliographical references (p. [405]-446) and index.

• 650 _0 |a Scanning electron microscope.

• 920 __ |a 222010 |z 1

• 998 __ |a SJT