机读格式显示(MARC)

• 000 00874cas a2200229 4500

• 001 0000332102

• 003 CAL

• 005 20200808092600.0

• 008 750720c19579999nyuar1 1 a0eng

• 010 __ |a 82642132

• 040 __ |c EST

• 090 __ |a O657.31/C748/13

• 093 __ |a O657.31 |2 5

• 099 __ |a CAL 021999663228

• 245 10 |a Advances in x-ray analysis, |n v. 13 : |b proceedings of the 8th annual Conference on Application of X-ray Analysis held Aug.6-8, 1969. / |c edited by Burton L. Henke and John B. Newkirk and Gavin R. Mallett; sponsored by University of Denver, Denver Research Institute.

• 260 __ |a New York : |b Plenum Press, |c 1970.

• 300 __ |a 681 p. : |b ill. ; |c 26 cm.

• 650 _0 |a X-rays |x Industrial applications |x Congresses.

• 650 _2 |a Chemistry, Analytical |x yearbooks.

• 650 _2 |a Radiography |x yearbooks.

• 710 2_ |a Denver Research Institute.

• 998 __ |a EST