机读格式显示(MARC)

• 000 00804cam a2200253 a 4500

• 001 0000327776

• 003 CAL

• 005 20200721095000.0

• 008 960926s1973 enka b 001 0 eng

• 020 __ |a 0080168388

• 040 __ |c SJT |d HST

• 050 00 |a TK275 |b .B667 1973

• 090 __ |a TM8/B785

• 093 __ |a TM835 |2 4

• 099 __ |a CAL 022000330011

• 100 1_ |a Bowdler, G. W. |0 CAL n2005026388# |7 ba0yba0y

• 245 10 |a Measurements in high-voltage test circuits / |c by G. W. Bowdler.

• 260 __ |a Oxford ; |a New York : |b Pergamon Press, |c 1973.

• 300 __ |a viii, 179 p. : |b illus. ; |c 21 cm.

• 440 _0 |a International series of monographs in electrical engineering ; |v v. 5

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Electric measurements.

• 650 _0 |a High voltages.

• 998 __ |a SJT