机读格式显示(MARC)

• 000 01469cam a2200373 a 4500

• 001 0000330934

• 003 CAL

• 005 20200831093300.0

• 008 820102s1980 ne a b 101 0 eng

• 010 __ |a 81106848

• 015 __ |a Ne***

• 020 __ |a 9090001468 (v. 1)

• 020 __ |a 9090001476 (v. 2)

• 020 __ |a 9090001484 (v. 3)

• 020 __ |a 9090001492 (v. 4)

• 020 __ |z 0909000145 (set)

• 040 __ |a DLC |c DLC |d DLC |d SCT

• 050 00 |a QH212.E4 |b E97 1980

• 090 __ |a TN153-53/E89/1

• 090 __ |a TN153-53/E89/3

• 093 __ |a TN153-53 |2 3

• 099 __ |a CAL 022000330657 |a CAL 022000405562 |a CAL 022000883889 |a CAL 021999623934 |a CAL 022000652797

• 111 2_ |a European Congress on Electron Microscopy |n (7th : |d 1980 : |c Hague, Netherlands)

• 245 10 |a Electron microscopy, 1980 : |b proceedings of the Seventh European Congress on Electron Microscopy, The Hague, The Netherlands, August 24-29, 1980.

• 260 __ |a Leiden : |b Seventh European Congress on Electron Microscopy Foundation, |c 1980.

• 300 __ |a 4 v. : |b ill. ; |c 27 cm.

• 500 __ |a Editors, P. Brederoo ... [et al.]

• 500 __ |a Incorporated the Ninth International Conference on X-ray Optics and Microanalysis.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Electron microscopy |v Congresses.

• 700 1_ |a Brederoo, P.

• 711 2_ |a International Conference on X-ray Optics and Microanalysis |n (9th : |d 1980 : |c Hague, Netherlands)

• 920 __ |a 580400 |z 2

• 998 __ |a SJT