机读格式显示(MARC)

• 000 00831pam a2200277 a 4500

• 001 0000333331

• 003 CAL

• 005 20200810151700.0

• 008 981214s1984 enka b 001 0 eng d

• 020 __ |a 0412233908

• 020 __ |a 0412234009 (pbk.)

• 040 __ |c SJT

• 050 00 |a TA417.23 |b .L67 1984

• 090 __ |a TB302.5/L869

• 093 __ |a TB302.5 |2 5

• 099 __ |a CAL 022000309056

• 100 1_ |a Loretto, M. H. |0 CAL n2005145354# |7 ba0yba0y

• 245 10 |a Electron beam analysis of materials / |c M.H. Loretto.

• 260 __ |a London ; |a New York : |b Chapman and Hall, |c c1984.

• 300 __ |a vi, 210 p. : |b ill. ; |c 23 cm.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Materials |x Analysis.

• 650 _0 |a Electron beams |x Industrial applications.

• 650 _0 |a Electron microscopy.

• 920 __ |a 222010 |z 1

• 998 __ |a SJT