机读格式显示(MARC)

• 000 00801cam a2200277 4500

• 001 0000333150

• 003 CAL

• 005 20200810092800.0

• 008 710716s1971 nyua b 001 0 eng

• 010 __ |a 79138916 //r86

• 020 __ |a 0471576182

• 035 __ |a 79138916 //r86

• 040 __ |c SJT

• 050 00 |a QC612.S4 |b M33

• 090 __ |a TN301/M425

• 093 __ |a TN301 |2 3

• 099 __ |a CAL 022000939516 |a CAL 022000322922

• 100 1_ |a Matare?, Herbert F. |q (Herbert Franz)

• 245 10 |a Defect electronics in semiconductors |c [by] Herbert F. Matare?.

• 260 __ |a New York, |b Wiley-Interscience |c 1971.

• 300 __ |a xi, 639 p. : |b ill. ; |c 24 cm.

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Semiconductors.

• 650 _0 |a Dislocations in crystals.

• 650 _0 |a Crystal lattices.

• 998 __ |a SJT