机读格式显示(MARC)

• 000 00857nam a2200229 a 4500

• 001 0000333723

• 003 CAL

• 005 20200811141400.0

• 008 750411s1969 nyu b 000 0 eng d

• 040 __ |a DLC |c DLC |d m.c. |d OCL |d STU |d AAA

• 090 __ |a TN-532/S989

• 093 __ |a TN-532 |2 4

• 099 __ |a CAL 0220110225995m

• 111 2_ |a Symposium on Reliability |d (1969 : |c Chicago, Illinois)

• 245 10 |a Proceedings 1969 Annual Symposium on Reliability : |b Chicago, Illinois, January 21, 22, 23, 1969 / |c sponsored by IEEE, IES, SNT, ASQC.

• 260 __ |a [New York : |b Institute of Electrical and Electronics Engineers, |c 1969].

• 300 __ |a vii, 654 p. : |b ill. ; |c 28 cm.

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Reliability (Engineering) |x Congresses.

• 710 2_ |a Institute of Electrical and Electronics Engineers.

• 920 __ |a 231030 |z 2

• 998 __ |a SJT