机读格式显示(MARC)

• 000 00894nam a22002177a 4500

• 001 0000332364

• 003 CAL

• 005 20200807105700.0

• 008 081010s1958 xx 000 0 eng d

• 040 __ |a ECN |c ECN

• 090 __ |a TN3-532/U58

• 093 __ |a TN3-532 |2 4

• 099 __ |a CALB022011175346

• 110 2_ |a United States. Advisory Group on Electron Tubes.

• 245 10 |a Proceedings of the transistor reliability symposium, Sept. 17 and 18, 1956 / |c sponsored by the Working Group on Semiconductor Devices of the Advisory Group on Electron Tubes, Office of the Assistant Secretary of Defense, Research, and Engineering.

• 260 __ |a N. Y. : |b N. Y. U. P., |c 1958.

• 300 __ |a 128 p. |c 24cm

• 710 2_ |a Working Group on Semiconductor Devices of the Advisory Group on Electron Tubes.

• 710 2_ |a Office of the Assistant Secretary of Defense, Research, and Engineering.

• 920 __ |a 231220 |z 2

• 998 __ |a ECN