机读格式显示(MARC)

• 000 00871cam a2200265 4500

• 001 0000330146

• 003 CAL

• 005 20200730131400.0

• 008 981216s1982 nyua b 00110 eng

• 020 __ |a 0824715535

• 040 __ |a DLC |c DLC |d DLC

• 090 __ |a TN153/M979

• 093 __ |a TN153

• 099 __ |a CAL 022000330656

• 100 1_ |a Murr, Lawrence Eugene. |0 CAL n2005176125# |7 ba0yba0y

• 245 10 |a Electron and ion microscopy and microanalysis : |b principles and applications / |c Lawrence E. Murr.

• 260 __ |a New York : |b Marcel Dekker, |c c1982.

• 300 __ |a xiv, 793 p. : |b ill. ; |c 27 cm.

• 490 1_ |a Optical engineering ; |v v. 1

• 504 __ |a Includes bibliographical references and indexes.

• 650 _0 |a Electron microscopy.

• 650 _0 |a Field ion microscopy.

• 650 _0 |a Microprobe analysis.

• 830 _0 |a Optical engineering (Marcel Dekker, Inc.) ; |v v. 1.

• 998 __ |a SJT