机读格式显示(MARC)

• 000 00939nam 2200361 a 4500

• 001 0000153636

• 003 CAL

• 005 20060905144900.0

• 008 060905s1986 nyua b 00110 eng

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• 037 __ |a 9009522 |b 185.74

• 040 __ |c SJT

• 090 __ |a 73.87237/M626

• 093 __ |a 73.87237 |2 4

• 099 __ |a CAL 022000306604 |a CAL 022000352872

• 100 1_ |a Miczo, Alexander.

• 245 10 |a Digital logic testing and simulation / |c Alexander Miczo.

• 260 __ |a New York : |b Harper & Row, |c c1986.

• 300 __ |a xiv, 414 p. : |b ill. ; |c 24 cm.

• 504 __ |a Includes bibliographies and index.

• 650 _0 |a Digital electronics |x Testing.

• 920 __ |a 211040 |z 1

• 920 __ |a 251030 |z 1

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• 920 __ |a 211030 |z 1

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• 998 __ |a SJT