机读格式显示(MARC)

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• 001 0000361533

• 003 CAL

• 005 20201118165200.0

• 008 750411s1959 nyu b 000 0 eng d

• 040 __ |a DLC |c DLC |d m.c. |d OCL |d STU |d AAA

• 090 __ |a TN-532/N277-3

• 093 __ |a TN-532 |2 4

• 099 __ |a CAL 0220110225983m

• 111 2_ |a National Symposium on Reliability & Quality Control in Electronics |n (5th : |d 1959 : |c Philadelphia, Pa.)

• 245 10 |a Proceedings Fifth National Symposium on Reliability & Quality Control in Electronics : |b Philadelphia, Pa. January 12-14, 1959 / |c sponsored by IRE, EIA, ASQC, AIEE.

• 260 __ |a [New York : |b Institute of Radio Engineers, |c 1959].

• 300 __ |a iv, 451 p. : |b ill. ; |c 28 cm.

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Quality control |x Congresses.

• 710 2_ |a Institute of Radio Engineers.

• 998 __ |a SJT