机读格式显示(MARC)

• 000 00673nam a2200217 4500

• 001 0000330008

• 003 CAL

• 005 20200730085400.0

• 008 981216s1984 nyua 10110 eng

• 040 __ |c SJT

• 090 __ |a TP274-53/A939

• 093 __ |a TP274-53

• 099 __ |a CAL 022000327791

• 111 2_ |a AUTOTESTCON |d (1984 : |c Washington, DC)

• 245 10 |a Autotestcon '84 : |b proceedings, 5-7 Nov., 1984, Sheraton-Washington Hotel, Washington, DC.

• 260 __ |a New York : |b IEEE, |c c1984.

• 300 __ |a 412 p. : |b ill. ; |c 28 cm.

• 504 __ |a Includes bibliographical references and index.

• 710 2_ |a Institute of Electrical and Electronics Engineers.

• 920 __ |a 211180 |z 1

• 998 __ |a SJT