机读格式显示(MARC)

• 000 01074nam a2200289 i 4500

• 001 0000332486

• 003 CAL

• 005 20200807145100.0

• 008 760115s1975 ja a b 10010 eng

• 010 __ |a 76350050

• 015 __ |a Ja***

• 040 __ |d TJU |c TJU

• 090 __ |a O43/I17

• 093 __ |a O43

• 099 __ |a CAL 021999645417

• 111 2_ |a ICO Conference on Optical Methods in Scientific and Industrial Measurements, |c Tokyo, |d 1974.

• 245 10 |a Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements, Tokyo, 26-30 August, 1974 / |c edited by Shun-ichi Tanaka.

• 260 __ |a Tokyo : |b Japanese Journal of Applied Physics, |c c1975.

• 300 __ |a xiii, 544 p. : |b ill. ; |c 27 cm.

• 440 _0 |a Japanese journal of applied physics : Supplement ; |v v. 14, 14-1

• 500 __ |a English, French, or German.

• 500 __ |a Errata sheet laid in.

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Optical measurements |x Congresses.

• 700 1_ |a Tanaka, Shun甶chi, |d 1926-

• 710 2_ |a International Commission for Optics.

• 998 __ |a TJU