机读格式显示(MARC)

• 000 01447nam a22003137a 4500

• 001 0000331028

• 003 CAL

• 005 20200803161500.0

• 008 760512s1964 paua b 100 0 eng

• 010 __ |a 63021661

• 040 __ |a DLC |c AKR |d OCL |d OCLCQ |d AGL |d STF |d ZWZ

• 050 04 |a QD95 |b .S95 1963

• 090 __ |a O657.3/A512

• 093 __ |a O657.3 |2 5

• 099 __ |a CALB022012019580

• 110 2_ |a American Society for Testing and Materials. |b Committee E-2 on Emission Spectroscopy.

• 245 10 |a Symposium on X-Ray and Electron Probe Analysis : |b papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.

• 260 __ |a Philadelphia : |b American Society for Testing and Materials, |c 1964.

• 300 __ |a vi, 209 p. : |b ill. ; |c 24 cm.

• 490 1_ |a ASTM special technical publication ; |v no. 349

• 500 __ |a "Sponsored jointly by ASTM Committees E-2 on Emission Spectroscopy and E-4 on Electron Metallography."

• 504 __ |a Includes bibliographical references.

• 650 _0 |a X-ray spectroscopy |v Congresses.

• 650 _0 |a Probes (Electronic instruments) |v Congresses.

• 710 2_ |a American Society for Testing and Materials. |b Committee E-4 on Metallography.

• 711 2_ |a Symposium on X-Ray and Electron Probe Analysis |d (1963 : |c Atlantic City)

• 810 2_ |a American Society for Testing and Materials. |t Special technical publication ; |v no. 349.

• 920 __ |a 211260 |z 0

• 998 __ |a BNU