机读格式显示(MARC)

• 000 01116cam a2200313 a 4500

• 001 0000332779

• 003 CAL

• 005 20200808102300.0

• 008 770907s1978 enka b 001 0 eng

• 010 __ |a 77013269

• 020 __ |a 0306357283

• 040 __ |a DLC |c DLC |d DLC

• 050 00 |a QC702.7.B65 |b N37 1976

• 090 __ |a O48/T458

• 093 __ |a O48

• 099 __ |a CAL 022000829711

• 100 0_ |a Thomas, Jean-Paul, |d 1944-

• 245 10 |a Material characterization using ion beams / |c edited by J. P. Thomas and A. Cachard.

• 260 __ |a London ; |a New York : |b Plenum Press, |c c1978.

• 300 __ |a xviii, 517 p. : |b ill. ; |c 26 cm.

• 440 _0 |a NATO advanced study institutes series : Series B, Physics ; |v v. 28

• 500 __ |a "Lectures presented at the NATO Advanced Study Institute on Material Characterization Using Ion Beams held in Aleria, Corsica, August 29-September 12, 1976."

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Ion bombardment.

• 650 _0 |a Materials |x Analysis.

• 650 _0 |a Solid-state physics.

• 700 1_ |a Thomas, Jean-Paul, |d 1944-

• 700 1_ |a Cachard, A.

• 998 __ |a ECN