机读格式显示(MARC)

• 000 01179cam 2200469 a 4500

• 001 0000154085

• 003 CAL

• 005 20060906143900.0

• 008 060906s1985 nyu b 00110 eng

• 010 __ |a 85005357 //r90

• 020 __ |a 0471827312

• 040 __ |a DLC |c DLC |d DLC

• 050 00 |a QA275 |b .J34 1985

• 082 00 |a 511/.43 |2 19

• 090 __ |a 71.268/J22

• 093 __ |a O241.1

• 094 __ |a 71.268 |2 3

• 099 __ |a CAL 022000285232

• 100 1_ |a Jaech, John L.

• 245 10 |a Statistical analysis of measurement errors / |c John L. Jaech.

• 260 __ |a New York : |b Wiley, |c c1985.

• 300 __ |a xxiii, 293 p. ; |c 24 cm.

• 500 __ |a "An Exxon monograph."

• 500 __ |a Includes index.

• 504 __ |a Bibliography: p. 263-264.

• 650 _0 |a Error analysis (Mathematics)

• 650 _0 |a Mensuration.

• 650 _0 |a Estimation theory.

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• 998 __ |a PUL