机读格式显示(MARC)

• 000 00891nam a2200253 a 4500

• 001 0000332929

• 003 CAL

• 005 20200811093700.0

• 008 981216s1986 nyua b 001 0 eng d

• 020 __ |a 0306423871

• 040 __ |c SJT

• 090 __ |a TN153/J88

• 093 __ |a TN153

• 099 __ |a CAL 022000317148

• 100 0_ |a Joy, David C., |d 1943- |0 CAL n2005120499# |7 ba0yba0y

• 245 00 |a Principles of analytical electron microscopy / |c edited by David C. Joy, Alton D. Romig, Jr., and Joseph I. Goldstein.

• 260 __ |a New York : |b Plenum Press, |c c1986.

• 300 __ |a xvi, 448 p. : |b ill. ; |c 23 cm.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Electron microscopy.

• 700 1_ |a Joy, David C., |d 1943- |0 CAL n2005120499# |7 ba0yba0y

• 700 1_ |a Romig, Alton D. |0 CAL n2005208387# |7 ba0yba0y

• 700 1_ |a Goldstein, Joseph, |d 1939- |0 CAL n2005088159# |7 ba0yba0y

• 998 __ |a SJT